カテゴリー

Various sizes and materials
to meet all needs

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Applications
Semiconductors
Flat Panel Display-related manufacturing equipment, etc.
Form of delivery
Cast products, forged products (block shape),
3D printer formed products
Material properties (example of measurement)

Classification:
Low carbon LEX

Properties:
Zero expansion, low thermal expansion, forgeable

Average coefficient of thermal expansion x ppm/℃ (10 to 40℃)0±0.19Expansion (%)28
Lower limit of application temperature (℃)-30Hardness (HB)137
0.2% yield strength (N/mm2)264Young’s modulus (GPa)133
Tensile strength (N/mm2)378Thermal conductivity W(/ m・K)13.8
Average coefficient of thermal expansion x ppm/℃ (10 to 40℃)0±0.19
Expansion (%)28
Lower limit of application temperature (℃)-30
Hardness (HB)137
0.2% yield strength (N/mm2)264
Young’s modulus (GPa)
133
Tensile strength (N/mm2)378
Thermal conductivity W(/ m・K)13.8
  • *The above physical property values are for cast products.
  • *Data other than the average coefficient of thermal expansion are examples of measurements and are not guaranteed.
  • *Young’s modulus is measured using the bending resonance method.
  • *Contents are subject to change without notice.

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Applications
Semiconductors, optical parts, etc.
Form of delivery
Cast products, forged products (block shape)
Material properties (example of measurement)

Classification:
Low carbon LEX

Properties:
Super Invar (equivalent),
extremely low thermal expansion, forgeable

Average coefficient of thermal expansion x ppm/℃ (10 to 40℃)≦0.8 Expansion (%)30
Lower limit of application temperature (℃)-50 Hardness (HB)133
0.2% yield strength (N/mm2)277 Young’s modulus (GPa)128
Tensile strength (N/mm2)372 Thermal conductivity W(/ m・K)13.1
Average coefficient of thermal expansion x ppm/℃ (10 to 40℃) ≦0.8
Expansion (%) 30
Lower limit of application temperature (℃) -50
Hardness (HB) 133
0.2% yield strength (N/mm2) 277
Young’s modulus (GPa)
128
Tensile strength (N/mm2) 372
Thermal conductivity W(/ m・K) 13.1
  • *The above physical property values are for cast products.
  • *Data other than the average coefficient of thermal expansion are examples of measurements and are not guaranteed.
  • *Young’s modulus is measured using the bending resonance method.
  • *Contents are subject to change without notice.

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Applications
Semiconductor-related manufacturing equipment,
aerospace-related parts, etc.
Form of delivery
Cast products, forged products (block shape)
Material properties (example of measurement)

Classification:
Low carbon LEX

Properties:
Co1% or less, low thermal expansion, forgeable

Average coefficient of thermal expansion x ppm/℃ (10 to 40℃) ≦1.5 Expansion (%) 29
Lower limit of application temperature (℃) -196 Hardness (HB)
0.2% yield strength (N/mm2) 198 Young’s modulus (GPa) 125
Tensile strength (N/mm2) 340 Thermal conductivity W(/ m・K)
Average coefficient of thermal expansion x ppm/℃ (10 to 40℃) ≦1.5
Expansion (%) 29
Lower limit of application temperature (℃) -196
Hardness (HB)
0.2% yield strength (N/mm2) 198
Young’s modulus (GPa)
125
Tensile strength (N/mm2) 340
Thermal conductivity W(/ m・K)
  • *The above physical property values are for cast products.
  • *Data other than the average coefficient of thermal expansion are examples of measurements and are not guaranteed.
  • *Young’s modulus is measured using the bending resonance method.
  • *Contents are subject to change without notice.

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Applications
Semiconductor-related manufacturing equipment,
aerospace-related parts, etc.
Form of delivery
Cast products, forged products (block shape)
Material properties (example of measurement)

Classification:
Low carbon LEX

Properties:
Low thermal expansion, forgeable, better mechanical properties than IF2

Average coefficient of thermal expansion x ppm/℃ (10 to 40℃) ≦1.5 Expansion (%) 32
Lower limit of application temperature (℃) -196 Hardness (HB)
0.2% yield strength (N/mm2) 212 Young’s modulus (GPa) 125
Tensile strength (N/mm2) 357 Thermal conductivity W(/ m・K) 13.5
Average coefficient of thermal expansion x ppm/℃ (10 to 40℃) ≦1.5
Expansion (%) 32
Lower limit of application temperature (℃) -196
Hardness (HB)
0.2% yield strength (N/mm2) 212
Young’s modulus (GPa)
125
Tensile strength (N/mm2) 357
Thermal conductivity W(/ m・K) 13.5
  • *The above physical property values are for cast products.
  • *Data other than the average coefficient of thermal expansion are examples of measurements and are not guaranteed.
  • *Young’s modulus is measured using the bending resonance method.
  • *Contents are subject to change without notice.

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Applications
Semiconductor-related manufacturing equipment, etc.
Form of delivery
Forged products
Material properties (example of measurement)

Classification:
High-carbon LEX

Properties:
Optimum low thermal expansion coefficient can be selected from a range of 1×ppm/℃ or less or 1 to 6×ppm/℃, castability and machinability

Average coefficient of thermal expansion x ppm/℃ (10 to 40℃) ≦1.0 Expansion (%) 15
Lower limit of application temperature (℃) 0 Hardness (HB) 145
0.2% yield strength (N/mm2) 300 Young’s modulus (GPa) 145
Tensile strength (N/mm2) 470 Thermal conductivity W(/ m・K) 13.5
Average coefficient of thermal expansion x ppm/℃ (10 to 40℃) ≦1.0
Expansion (%) 15
Lower limit of application temperature (℃) 0
Hardness (HB) 145
0.2% yield strength (N/mm2) 300
Young’s modulus (GPa)
130
Tensile strength (N/mm2) 470
Thermal conductivity W(/ m・K) 13.5
  • *Data other than the average coefficient of thermal expansion are examples of measurements and are not guaranteed.
  • *Young’s modulus is measured using the ultrasonic pulse method.
  • *Contents are subject to change without notice.

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Applications
Semiconductor-related manufacturing equipment, etc.
Form of delivery
Cast product
Material properties (example of measurement)

Classification:
High-carbon LEX

Properties:
Optimum low thermal expansion coefficient can be selected from a range of 1×ppm/℃ or less or 1 to 6×ppm/℃, castability, machinability, and low temperature stability

Average coefficient of thermal expansion x ppm/℃ (10 to 40℃) 1.0〜2.0 Expansion (%) 15
Lower limit of application temperature (℃) -196 Hardness (HB) 135
0.2% yield strength (N/mm2) 260 Young’s modulus (GPa) 130
Tensile strength (N/mm2) 440 Thermal conductivity W(/ m・K) 14.0
Average coefficient of thermal expansion x ppm/℃ (10 to 40℃) 1.0〜2.0
Expansion (%) 15
Lower limit of application temperature (℃) -196
Hardness (HB) 135
0.2% yield strength (N/mm2) 260
Young’s modulus (GPa)
130
Tensile strength (N/mm2) 440
Thermal conductivity W(/ m・K) 14.0
  • *Data other than the average coefficient of thermal expansion are examples of measurements and are not guaranteed.
  • *Young’s modulus is measured using the ultrasonic pulse method.
  • *Contents are subject to change without notice.

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Applications
Semiconductor-related manufacturing equipment, etc.
Form of delivery
Cast product
Material properties (example of measurement)

Classification:
High-carbon LEX

Properties:
Optimum low thermal expansion coefficient can be selected from a range of 1×ppm/℃ or less or 1 to 6×ppm/℃, castability, machinability, and low temperature stability

Average coefficient of thermal expansion x ppm/℃ (10 to 40℃) 2.0〜3.0 Expansion (%) 15
Lower limit of application temperature (℃) -250 Hardness (HB) 135
0.2% yield strength (N/mm2) 250 Young’s modulus (GPa) 130
Tensile strength (N/mm2) 430 Thermal conductivity W(/ m・K) 7.3
Average coefficient of thermal expansion x ppm/℃ (10 to 40℃) 2.0〜3.0
Expansion (%) 15
Lower limit of application temperature (℃) -250
Hardness (HB) 135
0.2% yield strength (N/mm2) 250
Young’s modulus (GPa)
130
Tensile strength (N/mm2) 430
Thermal conductivity W(/ m・K) 7.3
  • *Data other than the average coefficient of thermal expansion are examples of measurements and are not guaranteed.
  • *Young’s modulus is measured using the ultrasonic pulse method.
  • *Contents are subject to change without notice.

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Applications
Semiconductor-related manufacturing equipment, etc.
Form of delivery
Cast product
Material properties (example of measurement)

Classification:
High-carbon LEX

Properties:
Optimum low thermal expansion coefficient can be selected from a range of 1×ppm/℃ or less or 1 to 6×ppm/℃, castability, machinability, and low temperature stability

Average coefficient of thermal expansion x ppm/℃ (10 to 40℃) 3.0〜4.0 Expansion (%) 15
Lower limit of application temperature (℃) -250 Hardness (HB) 135
0.2% yield strength (N/mm2) 250 Young’s modulus (GPa) 130
Tensile strength (N/mm2) 430 Thermal conductivity W(/ m・K) 14.5
Average coefficient of thermal expansion x ppm/℃ (10 to 40℃) 3.0〜4.0
Expansion (%) 15
Lower limit of application temperature (℃) -250
Hardness (HB) 135
0.2% yield strength (N/mm2) 250
Young’s modulus (GPa)
130
Tensile strength (N/mm2) 430
Thermal conductivity W(/ m・K) 14.5
  • *Data other than the average coefficient of thermal expansion are examples of measurements and are not guaranteed.
  • *Young’s modulus is measured using the ultrasonic pulse method.
  • *Contents are subject to change without notice.

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Applications
Automobile manufacturing equipment parts,
semiconductor-related manufacturing equipment,
aerospace-related parts, etc.
Form of delivery
Cast product
Material properties (example of measurement)

Classification:
High-carbon LEX

Properties:
High temperature resistance

Average coefficient of thermal expansion x ppm/℃ (10 to 40℃) 3.5〜4.5 Expansion (%) 15
Lower limit of application temperature (℃) -30 Hardness (HB) 135
0.2% yield strength (N/mm2) 260 Young’s modulus (GPa) 135
Tensile strength (N/mm2) 440 Thermal conductivity W(/ m・K) 13.0
Average coefficient of thermal expansion x ppm/℃ (10 to 40℃) 3.5〜4.5
Expansion (%) 15
Lower limit of application temperature (℃) -30
Hardness (HB) 135
0.2% yield strength (N/mm2) 260
Young’s modulus (GPa)
135
Tensile strength (N/mm2) 440
Thermal conductivity W(/ m・K) 13.0
  • *Data other than the average coefficient of thermal expansion are examples of measurements and are not guaranteed.
  • *Young’s modulus is measured using the ultrasonic pulse method.
  • *Contents are subject to change without notice.

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Applications
Semiconductor-related manufacturing equipment, etc.
Form of delivery
Cast product
Material properties (example of measurement)

Classification:
High-carbon LEX

Properties:
Optimum low thermal expansion coefficient can be selected from a range of 1×ppm/℃ or less or 1 to 6×ppm/℃, castability, machinability, and low temperature stability

Average coefficient of thermal expansion x ppm/℃ (10 to 40℃) 4.0〜5.0 Expansion (%) 10
Lower limit of application temperature (℃) -250 Hardness (HB) 125
0.2% yield strength (N/mm2) 240 Young’s modulus (GPa) 125
Tensile strength (N/mm2) 420 Thermal conductivity W(/ m・K) 15.0
Average coefficient of thermal expansion x ppm/℃ (10 to 40℃) 4.0〜5.0
Expansion (%) 10
Lower limit of application temperature (℃) -250
Hardness (HB) 125
0.2% yield strength (N/mm2) 240
Young’s modulus (GPa)
125
Tensile strength (N/mm2) 420
Thermal conductivity W(/ m・K) 15.0
  • *Data other than the average coefficient of thermal expansion are examples of measurements and are not guaranteed.
  • *Young’s modulus is measured using the ultrasonic pulse method.
  • *Contents are subject to change without notice.

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Applications
Semiconductor-related manufacturing equipment, etc.
Form of delivery
Cast product
Material properties (example of measurement)

Classification:
High-carbon LEX

Properties:
Optimum low thermal expansion coefficient can be selected from a range of 1×ppm/℃ or less or 1 to 6×ppm/℃, castability, machinability, and low temperature stability

Average coefficient of thermal expansion x ppm/℃ (10 to 40℃) 5.0〜6.0 Expansion (%) 10
Lower limit of application temperature (℃) -250 Hardness (HB) 125
0.2% yield strength (N/mm2) 240 Young’s modulus (GPa) 125
Tensile strength (N/mm2) 420 Thermal conductivity W(/ m・K) 15.0
Average coefficient of thermal expansion x ppm/℃ (10 to 40℃) 5.0〜6.0
Expansion (%) 10
Lower limit of application temperature (℃) -250
Hardness (HB) 125
0.2% yield strength (N/mm2) 240
Young’s modulus (GPa)
125
Tensile strength (N/mm2) 420
Thermal conductivity W(/ m・K) 15.0
  • *Data other than the average coefficient of thermal expansion are examples of measurements and are not guaranteed.
  • *Young’s modulus is measured using the ultrasonic pulse method.
  • *Contents are subject to change without notice.